Rodewald, J.; Thien, J.; Ruwisch, K.; Pohlmann, T.; Hoppe, M.; Schmalhorst, J.; Küpper, K.; Wollschläger, J.
Structure-Related Electronic and Magnetic Properties in Ultrathin Epitaxial NixFe3−xO4 Films on MgO(001). Nanomaterials 2024, 14, 694.
https://doi.org/10.3390/nano14080694
AMA Style
Rodewald J, Thien J, Ruwisch K, Pohlmann T, Hoppe M, Schmalhorst J, Küpper K, Wollschläger J.
Structure-Related Electronic and Magnetic Properties in Ultrathin Epitaxial NixFe3−xO4 Films on MgO(001). Nanomaterials. 2024; 14(8):694.
https://doi.org/10.3390/nano14080694
Chicago/Turabian Style
Rodewald, Jari, Jannis Thien, Kevin Ruwisch, Tobias Pohlmann, Martin Hoppe, Jan Schmalhorst, Karsten Küpper, and Joachim Wollschläger.
2024. "Structure-Related Electronic and Magnetic Properties in Ultrathin Epitaxial NixFe3−xO4 Films on MgO(001)" Nanomaterials 14, no. 8: 694.
https://doi.org/10.3390/nano14080694
APA Style
Rodewald, J., Thien, J., Ruwisch, K., Pohlmann, T., Hoppe, M., Schmalhorst, J., Küpper, K., & Wollschläger, J.
(2024). Structure-Related Electronic and Magnetic Properties in Ultrathin Epitaxial NixFe3−xO4 Films on MgO(001). Nanomaterials, 14(8), 694.
https://doi.org/10.3390/nano14080694