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Journal: Nanomaterials, 2024
Volume: 14
Number: 1529

Article: Characterization of Trap States in AlGaN/GaN MIS-High-Electron-Mobility Transistors under Semi-on-State Stress
Authors: by Ye Liang, Jiachen Duan, Ping Zhang, Kain Lu Low, Jie Zhang and Wen Liu
Link: https://www.mdpi.com/2079-4991/14/18/1529

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