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Journal: Nanomaterials, 2024
Volume: 14
Number: 1324
1324
Article: Gamma-Irradiation-Induced Electrical Characteristic Variations in MoS₂ Field-Effect Transistors with Buried Local Back-Gate Structure
Authors: by Su Jin Kim, Seungkwon Hwang, Jung-Dae Kwon, Jongwon Yoon, Jeong Min Park, Yongsu Lee, Yonghun Kim and Chang Goo Kang
Link: https://www.mdpi.com/2079-4991/14/16/1324

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