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Journal: Nanomaterials, 2024
Volume: 14
Number: 1038

Article: Distinguishing the Charge Trapping Centers in CaF2-Based 2D Material MOSFETs
Authors: by Zhe Zhao, Tao Xiong, Jian Gong and Yue-Yang Liu
Link: https://www.mdpi.com/2079-4991/14/12/1038

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