Chang, H.; Wang, G.; Yang, H.; Liu, Q.; Zhou, L.; Ji, Z.; Yu, R.; Wu, Z.; Yin, H.; Du, A.;
et al. Insight into over Repair of Hot Carrier Degradation by GIDL Current in Si p-FinFETs Using Ultra-Fast Measurement Technique. Nanomaterials 2023, 13, 1259.
https://doi.org/10.3390/nano13071259
AMA Style
Chang H, Wang G, Yang H, Liu Q, Zhou L, Ji Z, Yu R, Wu Z, Yin H, Du A,
et al. Insight into over Repair of Hot Carrier Degradation by GIDL Current in Si p-FinFETs Using Ultra-Fast Measurement Technique. Nanomaterials. 2023; 13(7):1259.
https://doi.org/10.3390/nano13071259
Chicago/Turabian Style
Chang, Hao, Guilei Wang, Hong Yang, Qianqian Liu, Longda Zhou, Zhigang Ji, Ruixi Yu, Zhenhua Wu, Huaxiang Yin, Anyan Du,
and et al. 2023. "Insight into over Repair of Hot Carrier Degradation by GIDL Current in Si p-FinFETs Using Ultra-Fast Measurement Technique" Nanomaterials 13, no. 7: 1259.
https://doi.org/10.3390/nano13071259
APA Style
Chang, H., Wang, G., Yang, H., Liu, Q., Zhou, L., Ji, Z., Yu, R., Wu, Z., Yin, H., Du, A., Li, J., Luo, J., Zhao, C., & Wang, W.
(2023). Insight into over Repair of Hot Carrier Degradation by GIDL Current in Si p-FinFETs Using Ultra-Fast Measurement Technique. Nanomaterials, 13(7), 1259.
https://doi.org/10.3390/nano13071259
