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Journal: Nanomaterials, 2023
Volume: 13
Number: 638

Article: Effects of Charge Trapping on Memory Characteristics for HfO2-Based Ferroelectric Field Effect Transistors
Authors: by Jianjian Wang, Jinshun Bi, Yannan Xu, Gang Niu, Mengxin Liu and Viktor Stempitsky
Link: https://www.mdpi.com/2079-4991/13/4/638

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