Jurczyk, J.; Pillatsch, L.; Berger, L.; Priebe, A.; Madajska, K.; Kapusta, C.; Szymańska, I.B.; Michler, J.; Utke, I.
In Situ Time-of-Flight Mass Spectrometry of Ionic Fragments Induced by Focused Electron Beam Irradiation: Investigation of Electron Driven Surface Chemistry inside an SEM under High Vacuum. Nanomaterials 2022, 12, 2710.
https://doi.org/10.3390/nano12152710
AMA Style
Jurczyk J, Pillatsch L, Berger L, Priebe A, Madajska K, Kapusta C, Szymańska IB, Michler J, Utke I.
In Situ Time-of-Flight Mass Spectrometry of Ionic Fragments Induced by Focused Electron Beam Irradiation: Investigation of Electron Driven Surface Chemistry inside an SEM under High Vacuum. Nanomaterials. 2022; 12(15):2710.
https://doi.org/10.3390/nano12152710
Chicago/Turabian Style
Jurczyk, Jakub, Lex Pillatsch, Luisa Berger, Agnieszka Priebe, Katarzyna Madajska, Czesław Kapusta, Iwona B. Szymańska, Johann Michler, and Ivo Utke.
2022. "In Situ Time-of-Flight Mass Spectrometry of Ionic Fragments Induced by Focused Electron Beam Irradiation: Investigation of Electron Driven Surface Chemistry inside an SEM under High Vacuum" Nanomaterials 12, no. 15: 2710.
https://doi.org/10.3390/nano12152710
APA Style
Jurczyk, J., Pillatsch, L., Berger, L., Priebe, A., Madajska, K., Kapusta, C., Szymańska, I. B., Michler, J., & Utke, I.
(2022). In Situ Time-of-Flight Mass Spectrometry of Ionic Fragments Induced by Focused Electron Beam Irradiation: Investigation of Electron Driven Surface Chemistry inside an SEM under High Vacuum. Nanomaterials, 12(15), 2710.
https://doi.org/10.3390/nano12152710