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Journal: Nanomaterials, 2022
Volume: 12
Number: 1743
1743
Article: Silicon-Controlled Rectifier Embedded Diode for 7 nm FinFET Process Electrostatic Discharge Protection
Authors: by Xinyu Zhu, Shurong Dong, Fangjun Yu, Feifan Deng, Kalya Shubhakar, Kin Leong Pey and Jikui Luo
Link: https://www.mdpi.com/2079-4991/12/10/1743

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