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Computation 2018, 6(1), 12;

A Microwave Reflectometry Technique for Profiling the Dielectric-Conductivity Properties of the Hagia Sophia Globe

Hellenic Naval Academy, Hatzikyriakou Ave., Piraeus 18539, Greece
Department of Informatics and Telecommunication, National and Kapodistrian University of Athens, Panepistimiopolis, Ilisia, Athens 15784, Greece
School of Electrical and Computer Engineering, National Technical University of Athens, Zografou Campus, 9, Iroon Polytechniou Str., Zografou 15780, Greece
Author to whom correspondence should be addressed.
Received: 15 December 2017 / Revised: 27 January 2018 / Accepted: 31 January 2018 / Published: 2 February 2018
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A microwave free space reflectometry technique with swept frequency measurements for the profiling of wall structures and the detection of hidden (covered) layers has been applied to the Hagia Sophia byzantine monument. Experimental measurement results are presented and compared with three-dimensional (3D) simulated results, exhibiting fair agreement in some (though not all) aspects. Based on the experimental results, the possibility of clear discrimination between regions with and without covered mosaic layers, and hence the detection of such layers, is demonstrated. View Full-Text
Keywords: non-destructive techniques; microwaves; horn antenna; reflectometry non-destructive techniques; microwaves; horn antenna; reflectometry

Figure 1

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Vazouras, C.; Kasapoglu, G.B.; Karagianni, E.A.; Uzunoglu, N.K. A Microwave Reflectometry Technique for Profiling the Dielectric-Conductivity Properties of the Hagia Sophia Globe. Computation 2018, 6, 12.

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