A Microwave Reflectometry Technique for Profiling the Dielectric-Conductivity Properties of the Hagia Sophia Globe
Abstract
:1. Introduction
2. Materials and Methods
3. Results
- the simulated data (and, of course, the measured ones) exhibit the fluctuating behavior expected for the stratified structure under consideration
- the density of the fluctuations seems to depend mainly on the thickness of the third layer (red brick), which was significantly increased accordingly
- the depth of the fluctuations seems to depend mainly on the difference between the dielectric parameters of the second (glass) and third (red brick) layer; a slight decrease of the glass permittivity and an increase of the brick permittivity beyond the values reported in the literature (which in any event refer to materials and frequency ranges not identical to the ones actually measured in the Hagia Sophia) result in better matching of the experimental results
- matching of the overall form of the fluctuations is improved with a slight increase in the depth of the first (lime) and second (glass) layer (as compared with the initial benchmark values adopted).
4. Discussion
5. Conclusions
Author Contributions
Conflicts of Interest
References
- Moropoulou, A.; Koui, M.; Avdelidis, N.P.; Delegou, E.T.; Aggelakopoulou, E.; Karoglou, M.; Karmis, P.; Aggelopoulos, A.; Griniezakis, S.; Karagianni, E.A.; et al. Investigation for the Compatibility of Conservation Interventions on Hagia Sophia Mosaics Using NDT. J. Eur. Study Group Phys. Chem. Biol. Math. Tech. Appl. Archaeol. 2000, 59, 103–120. [Google Scholar]
- Musil, J.; Zacek, F. Microwave Measurements of Complex Permittivity by Free Space Methods and Their Applications; Elsevier: Amsterdam, The Netherlands, 1986. [Google Scholar]
- Ghodgaonkar, D.K.; Varadan, V.V.; Varadan, V.K. A free-space method for measurement of dielectric constants and loss tangents at microwave frequencies. IEEE Trans. Instrum. Meas. 1989, 38, 789–793. [Google Scholar] [CrossRef]
- Maurens, M.; Priou, A.; Brunier, P.; Aussudre, S.; Lopez, M.; Combes, P. Free-Space Microwave Measurement Technique for Composite Minerals. Prog. Electromagn. Res. 1992, 6, 345–385. [Google Scholar]
- Safaai-Jazi, A.; Riad, S.M.; Muqaibel, A.; Bayram, A. Through-The-Wall Propagation and Material Characterization; DARPA NETEX Program Report; Virginia Polytechnic Institute and State University: Blacksburg, VA, USA, 2002. [Google Scholar]
- Pisa, S.; Pittella, E.; Piuzzi, E.; D’Atanasio, P.; Zambotti, A. Permittivity measurement on construction materials through free space method. In Proceedings of the 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), Turin, Italy, 22–25 May 2017; pp. 1–4. [Google Scholar]
- Ghim, Y.-S.; Suratkar, A.; Davies, A. Reflectometry-based wavelength scanning interferometry for thickness measurements of very thin wafers. Opt. Express 2010, 18, 6522–6529. [Google Scholar] [CrossRef] [PubMed]
- Schibille, N. Hagia Sophia and the Byzantine Aesthetic Experience; Ashgate: London, UK, 2014. [Google Scholar]
- Chunlu Art History. Available online: https://chunlu.wordpress.com/6-the-pendentive-structure-of-hagia-sophia/ (accessed on 1 December 2017).
- Parkhomenko, E.I. Electrical Properties of Rocks; Plenum Press: New York, NY, USA, 1967. [Google Scholar]
- HyperPhysics Concepts. Available online: http://hyperphysics.phy-astr.gsu.edu/hbase/tables/diel.html (accessed on 1 December 2017).
- Pozar, D.M. Microwave Engineering, 4th ed.; Wiley: New York, NY, USA, 2012. [Google Scholar]
- Wilson, R. Propagation Losses through Common Building Materials; Magis Networks Inc.: San Diego, CA, USA, 2002. [Google Scholar]
- Balanis, C.A. Advanced Engineering Electromagnetics, 2nd ed.; Wiley: New York, NY, USA, 2012. [Google Scholar]
Material | Relative Permittivity εr | Conductivity σ (S/m) | Source |
---|---|---|---|
Lime (CaO) | 7.4 | = 4.76 × 10−6 | [10] |
= 4.35 × 10−8 | |||
Glass | 5–10 | = 7 × 10−3 | [11,12] |
Red Brick | ≅6 1 | ≅ 0.034 2 | [13] |
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Vazouras, C.; Kasapoglu, G.B.; Karagianni, E.A.; Uzunoglu, N.K. A Microwave Reflectometry Technique for Profiling the Dielectric-Conductivity Properties of the Hagia Sophia Globe. Computation 2018, 6, 12. https://doi.org/10.3390/computation6010012
Vazouras C, Kasapoglu GB, Karagianni EA, Uzunoglu NK. A Microwave Reflectometry Technique for Profiling the Dielectric-Conductivity Properties of the Hagia Sophia Globe. Computation. 2018; 6(1):12. https://doi.org/10.3390/computation6010012
Chicago/Turabian StyleVazouras, Christos, George B. Kasapoglu, Evangelia A. Karagianni, and Nikolaos K. Uzunoglu. 2018. "A Microwave Reflectometry Technique for Profiling the Dielectric-Conductivity Properties of the Hagia Sophia Globe" Computation 6, no. 1: 12. https://doi.org/10.3390/computation6010012
APA StyleVazouras, C., Kasapoglu, G. B., Karagianni, E. A., & Uzunoglu, N. K. (2018). A Microwave Reflectometry Technique for Profiling the Dielectric-Conductivity Properties of the Hagia Sophia Globe. Computation, 6(1), 12. https://doi.org/10.3390/computation6010012