Wu, Q.; Lei, H.; Mao, T.; Deng, Y.; Zhang, X.; Jiang, Y.; Zhong, X.; Detre, J.A.; Liu, J.; Rao, H.
Test-Retest Reliability of Resting Brain Small-World Network Properties across Different Data Processing and Modeling Strategies. Brain Sci. 2023, 13, 825.
https://doi.org/10.3390/brainsci13050825
AMA Style
Wu Q, Lei H, Mao T, Deng Y, Zhang X, Jiang Y, Zhong X, Detre JA, Liu J, Rao H.
Test-Retest Reliability of Resting Brain Small-World Network Properties across Different Data Processing and Modeling Strategies. Brain Sciences. 2023; 13(5):825.
https://doi.org/10.3390/brainsci13050825
Chicago/Turabian Style
Wu, Qianying, Hui Lei, Tianxin Mao, Yao Deng, Xiaocui Zhang, Yali Jiang, Xue Zhong, John A. Detre, Jianghong Liu, and Hengyi Rao.
2023. "Test-Retest Reliability of Resting Brain Small-World Network Properties across Different Data Processing and Modeling Strategies" Brain Sciences 13, no. 5: 825.
https://doi.org/10.3390/brainsci13050825
APA Style
Wu, Q., Lei, H., Mao, T., Deng, Y., Zhang, X., Jiang, Y., Zhong, X., Detre, J. A., Liu, J., & Rao, H.
(2023). Test-Retest Reliability of Resting Brain Small-World Network Properties across Different Data Processing and Modeling Strategies. Brain Sciences, 13(5), 825.
https://doi.org/10.3390/brainsci13050825
