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Appl. Sci. 2018, 8(6), 879;

X-ray Free-Electron Laser

Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan
Received: 22 May 2018 / Revised: 24 May 2018 / Accepted: 24 May 2018 / Published: 28 May 2018
(This article belongs to the Special Issue X-Ray Free-Electron Laser)
Full-Text   |   PDF [152 KB, uploaded 28 May 2018]
Note: In lieu of an abstract, this is an excerpt from the first page.


During the last decades, the advent of the short-wavelength Free Electron Lasers (FELs) in the range from extreme ultraviolet (XUV) to hard X-rays has opened a new research avenue for the investigations of ultrafast electronic and structural dynamics in any form of matter[...] View Full-Text
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited (CC BY 4.0).

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Ueda, K. X-ray Free-Electron Laser. Appl. Sci. 2018, 8, 879.

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