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Appl. Sci. 2018, 8(3), 321;

Characteristic Analysis of Compact Spectrometer Based on Off-Axis Meta-Lens

Centre for Optical and Electromagnetic Research, State Key Lab of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310058, China
Author to whom correspondence should be addressed.
Received: 18 January 2018 / Revised: 14 February 2018 / Accepted: 23 February 2018 / Published: 26 February 2018
(This article belongs to the Special Issue Metasurfaces: Physics and Applications)
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Ultra-compact spectrometers with high-resolution and/or broadband features have long been pursued for their wide application prospects. The off-axis meta-lens, a new species of planar optical instruments, provides a unique and feasible way to realize these goals. Here we give a detailed investigation of the influences of structural parameters of meta-lens-based spectrometers on the effective spectral range and the spectral resolution using both wave optics and geometrical optics methods. Aimed for different usages, two types of meta-lens based spectrometers are numerically proposed: one is a wideband spectrometer working at 800–1800 nm wavelengths with the spectral resolution of 2–5 nm and the other is a narrowband one working at the 780–920 nm band but with a much higher spectral resolution of 0.15–0.6 nm. The tolerance for fabrication errors is also discussed in the end. These provides a prominent way to design and integrate planar film-based spectrometers for various instrumental applications. View Full-Text
Keywords: meta-lens; metasurface; spectrometer; dispersion; off-axis optical system meta-lens; metasurface; spectrometer; dispersion; off-axis optical system

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Zhou, Y.; Chen, R.; Ma, Y. Characteristic Analysis of Compact Spectrometer Based on Off-Axis Meta-Lens. Appl. Sci. 2018, 8, 321.

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