Park, H.; Kim, T.; Lee, H.; Shin, D.; Shin, D.; Park, M.
A Continual Learning Process to Detect Both Previously Learned and Newly Emerging Attack. Appl. Sci. 2025, 15, 10034.
https://doi.org/10.3390/app151810034
AMA Style
Park H, Kim T, Lee H, Shin D, Shin D, Park M.
A Continual Learning Process to Detect Both Previously Learned and Newly Emerging Attack. Applied Sciences. 2025; 15(18):10034.
https://doi.org/10.3390/app151810034
Chicago/Turabian Style
Park, Hansol, Taesu Kim, Hanhee Lee, Dongil Shin, Dongkyoo Shin, and Moosung Park.
2025. "A Continual Learning Process to Detect Both Previously Learned and Newly Emerging Attack" Applied Sciences 15, no. 18: 10034.
https://doi.org/10.3390/app151810034
APA Style
Park, H., Kim, T., Lee, H., Shin, D., Shin, D., & Park, M.
(2025). A Continual Learning Process to Detect Both Previously Learned and Newly Emerging Attack. Applied Sciences, 15(18), 10034.
https://doi.org/10.3390/app151810034