Ran, S.-C.; Wang, Q.-A.; Wang, J.-F.; Ni, Y.-Q.; Guo, Z.-X.; Luo, Y.
A Concise State-of-the-Art Review of Crack Monitoring Enabled by RFID Technology. Appl. Sci. 2024, 14, 3213.
https://doi.org/10.3390/app14083213
AMA Style
Ran S-C, Wang Q-A, Wang J-F, Ni Y-Q, Guo Z-X, Luo Y.
A Concise State-of-the-Art Review of Crack Monitoring Enabled by RFID Technology. Applied Sciences. 2024; 14(8):3213.
https://doi.org/10.3390/app14083213
Chicago/Turabian Style
Ran, Sheng-Cai, Qi-Ang Wang, Jun-Fang Wang, Yi-Qing Ni, Zhong-Xu Guo, and Yang Luo.
2024. "A Concise State-of-the-Art Review of Crack Monitoring Enabled by RFID Technology" Applied Sciences 14, no. 8: 3213.
https://doi.org/10.3390/app14083213
APA Style
Ran, S.-C., Wang, Q.-A., Wang, J.-F., Ni, Y.-Q., Guo, Z.-X., & Luo, Y.
(2024). A Concise State-of-the-Art Review of Crack Monitoring Enabled by RFID Technology. Applied Sciences, 14(8), 3213.
https://doi.org/10.3390/app14083213