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Journal: Appl. Sci., 2024
Volume: 14
Number: 6689
Article:
Systematic Analysis of Spacer and Gate Length Scaling on Memory Characteristics in 3D NAND Flash Memory
Authors:
by
Hee Young Bae, Seul Ki Hong and Jong Kyung Park
Link:
https://www.mdpi.com/2076-3417/14/15/6689
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