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Journal: Appl. Sci., 2023
Volume: 13
Number: 5507
Article:
Deep Convolutional Generative Adversarial Networks-Based Data Augmentation Method for Classifying Class-Imbalanced Defect Patterns in Wafer Bin Map
Authors:
by
Sangwoo Park and Cheolwoo You
Link:
https://www.mdpi.com/2076-3417/13/9/5507
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