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Journal: Appl. Sci., 2022
Volume: 12
Number: 5532
5532
Article: Degradation Characteristics and Reliability Assessment of 1310 nm VCSEL for Microwave Photonic Link
Authors: by Wenyuan Liao, Rui Gao, Yuebo Liu, Jide Zhang, Shuwang Li, Hao Niu, Shaohua Yang and Canxiong Lai
Link: https://www.mdpi.com/2076-3417/12/11/5532

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