Liao, W.; Gao, R.; Liu, Y.; Zhang, J.; Li, S.; Niu, H.; Yang, S.; Lai, C.
Degradation Characteristics and Reliability Assessment of 1310 nm VCSEL for Microwave Photonic Link. Appl. Sci. 2022, 12, 5532.
https://doi.org/10.3390/app12115532
AMA Style
Liao W, Gao R, Liu Y, Zhang J, Li S, Niu H, Yang S, Lai C.
Degradation Characteristics and Reliability Assessment of 1310 nm VCSEL for Microwave Photonic Link. Applied Sciences. 2022; 12(11):5532.
https://doi.org/10.3390/app12115532
Chicago/Turabian Style
Liao, Wenyuan, Rui Gao, Yuebo Liu, Jide Zhang, Shuwang Li, Hao Niu, Shaohua Yang, and Canxiong Lai.
2022. "Degradation Characteristics and Reliability Assessment of 1310 nm VCSEL for Microwave Photonic Link" Applied Sciences 12, no. 11: 5532.
https://doi.org/10.3390/app12115532
APA Style
Liao, W., Gao, R., Liu, Y., Zhang, J., Li, S., Niu, H., Yang, S., & Lai, C.
(2022). Degradation Characteristics and Reliability Assessment of 1310 nm VCSEL for Microwave Photonic Link. Applied Sciences, 12(11), 5532.
https://doi.org/10.3390/app12115532