Order Article Reprints
Journal: Appl. Sci., 2021
Volume: 11
Number: 9508
Article:
A Review on Machine and Deep Learning for Semiconductor Defect Classification in Scanning Electron Microscope Images
Authors:
by
Francisco López de la Rosa, Roberto Sánchez-Reolid, José L. Gómez-Sirvent, Rafael Morales and Antonio Fernández-Caballero
Link:
https://www.mdpi.com/2076-3417/11/20/9508
MDPI offers high quality article reprints with convenient shipping to destinations worldwide. Each reprint features a 270 gsm bright white cover
and 105 gsm premium white paper, bound with two stitches for durability and printed in full color. The cover design is customized to your article
and designed to be complimentary to the journal.