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        Journal: Appl. Sci., 2021
        Volume: 11 
                	Number: 9508 
                
        
        Article:
        A Review on Machine and Deep Learning for Semiconductor Defect Classification in Scanning Electron Microscope Images 
        Authors: 
       	by
                    Francisco López de la Rosa, Roberto Sánchez-Reolid, José L. Gómez-Sirvent, Rafael Morales and Antonio Fernández-Caballero        
        Link:
        https://www.mdpi.com/2076-3417/11/20/9508
        
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