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Journal: Appl. Sci., 2021
Volume: 11
Number: 9508

Article: A Review on Machine and Deep Learning for Semiconductor Defect Classification in Scanning Electron Microscope Images
Authors: by Francisco López de la Rosa, Roberto Sánchez-Reolid, José L. Gómez-Sirvent, Rafael Morales and Antonio Fernández-Caballero
Link: https://www.mdpi.com/2076-3417/11/20/9508

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