Lee, G.W.; Choi, Y.; Kim, H.; Park, J.; Shim, J.-I.; Shin, D.-S.
Analysis of Transient Degradation Behaviors of Organic Light-Emitting Diodes under Electrical Stress. Appl. Sci. 2021, 11, 7627.
https://doi.org/10.3390/app11167627
AMA Style
Lee GW, Choi Y, Kim H, Park J, Shim J-I, Shin D-S.
Analysis of Transient Degradation Behaviors of Organic Light-Emitting Diodes under Electrical Stress. Applied Sciences. 2021; 11(16):7627.
https://doi.org/10.3390/app11167627
Chicago/Turabian Style
Lee, Gyeong Won, Yoonsuk Choi, Heejin Kim, Jongwoo Park, Jong-In Shim, and Dong-Soo Shin.
2021. "Analysis of Transient Degradation Behaviors of Organic Light-Emitting Diodes under Electrical Stress" Applied Sciences 11, no. 16: 7627.
https://doi.org/10.3390/app11167627
APA Style
Lee, G. W., Choi, Y., Kim, H., Park, J., Shim, J.-I., & Shin, D.-S.
(2021). Analysis of Transient Degradation Behaviors of Organic Light-Emitting Diodes under Electrical Stress. Applied Sciences, 11(16), 7627.
https://doi.org/10.3390/app11167627