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Journal: Appl. Sci., 2020
Volume: 10
Number: 4799
Article:
High-Precision Cutting Edge Radius Measurement of Single Point Diamond Tools Using an Atomic Force Microscope and a Reverse Cutting Edge Artifact
Authors:
by
Kai Zhang, Yindi Cai, Yuki Shimizu, Hiraku Matsukuma and Wei Gao
Link:
https://www.mdpi.com/2076-3417/10/14/4799
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