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Crystals 2018, 8(2), 67;

A Study of Extended Defects in Surface Damaged Crystals

IMEM Institute, National Research Council, 43124 Parma, Italy
National Institute of Materials Physics, 077125 Magurele, Romania
Author to whom correspondence should be addressed.
Received: 7 November 2017 / Revised: 9 January 2018 / Accepted: 24 January 2018 / Published: 30 January 2018
(This article belongs to the Special Issue Crystal Indentation Hardness)
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We have analyzed by transmission electron microscopy silicon and GaAs crystals polished with sandpapers of different grain size. The surface damage induced a crystal permanent convex curvature with a radius of the order of a few meters. The curvature is due to a compressive strain generated in the damaged zone of the sample. Contrary to what was reported in the literature, the only defects detected by transmission electron microscopy were dislocations penetrating a few microns from the surface. Assuming the surface damage as a kind of continuous indentation, a simple model able to explain the observed compressive strain is given. View Full-Text
Keywords: curved crystals; surface damaged crystals; dislocation generation; crystal indentation curved crystals; surface damaged crystals; dislocation generation; crystal indentation

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Ferrari, C.; Ghica, C.; Rotunno, E. A Study of Extended Defects in Surface Damaged Crystals. Crystals 2018, 8, 67.

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