Next Article in Journal
The Neutron Macromolecular Crystallography Instruments at Oak Ridge National Laboratory: Advances, Challenges, and Opportunities
Previous Article in Journal
Frequency Conversion in KTP Crystal and Its Isomorphs
Article Menu
Issue 10 (October) cover image

Export Article

Open AccessArticle
Crystals 2018, 8(10), 387; https://doi.org/10.3390/cryst8100387

Study of Detector-Grade CdMnTe:In Crystals Obtained by a Multi-Step Post-Growth Annealing Method

1
School of Materials Science and Engineering, Chang’an University, Xi’an 710061, China
2
State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi’an 710072, China
*
Author to whom correspondence should be addressed.
Received: 8 August 2018 / Revised: 5 October 2018 / Accepted: 7 October 2018 / Published: 11 October 2018
Full-Text   |   PDF [5410 KB, uploaded 22 October 2018]   |  

Abstract

A multi-step annealing method was successfully applied to inclusions reduction and resistivity improvement of CdMnTe:In (CMT:In) single crystals with high resistivity, including a Cd atmosphere annealing step followed by a Te atmosphere annealing step. After the Cd atmosphere annealing step, the density of Te inclusions was reduced distinctly, and it could be also decreased in the subsequent step of re-annealing under Te atmosphere. Both the resistivity and IR transmittance decreased notably after Cd atmosphere annealing, whereas they increased tremendously after re-annealing under a Te atmosphere. The reduction of full-width at-half-maximum (FWHM) and the increase of the intensity of the X-ray rocking curve indicated an improvement of the crystal quality. Meanwhile, after Cd atmosphere annealing, the increase of the intensity of the (D0,X) peak and the disappearance of the (A0,X) peak in photoluminescence (PL) measurements suggested further that the crystal quality was improved. The detector performance was enhanced obviously after annealing. The higher the annealing temperature, the better the performance was. The detector fabricated by CMT:In slice (Cd atmosphere annealing at 1073 K for 240 h and Te atmosphere re-annealing at 773 K for 120 h) with 9.43% energy resolution and 1.25 × 10−3 cm2/V μτ value had the best detector performance. View Full-Text
Keywords: CdMnTe:In; Te inclusions; resistivity; crystal quality; radiation detector CdMnTe:In; Te inclusions; resistivity; crystal quality; radiation detector
Figures

Figure 1

This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited (CC BY 4.0).
SciFeed

Share & Cite This Article

MDPI and ACS Style

Yu, P.; Chen, Y.; Li, W.; Liu, W.; Liu, B.; Yang, J.; Ni, K.; Luan, L.; Zheng, J.; Li, Z.; Bai, M.; Sun, G.; Li, H.; Jie, W. Study of Detector-Grade CdMnTe:In Crystals Obtained by a Multi-Step Post-Growth Annealing Method. Crystals 2018, 8, 387.

Show more citation formats Show less citations formats

Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Related Articles

Article Metrics

Article Access Statistics

1

Comments

[Return to top]
Crystals EISSN 2073-4352 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert
Back to Top