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Journal: Crystals, 2024
Volume: 14
Number: 753
Article:
Electronic Properties of Atomic Layer Deposited HfO2 Thin Films on InGaAs Compared to HfO2/GaAs Semiconductors
Authors:
by
Irving K. Cashwell, Jr., Donovan A. Thomas, Jonathan R. Skuza and Aswini K. Pradhan
Link:
https://www.mdpi.com/2073-4352/14/9/753
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