Gong, T.; Xie, L.; Chen, S.; Lu, X.; Zhao, M.; Zhu, J.; Yang, X.; Wang, Z.
Research on Crystal Structure Evolution and Failure Mechanism during TSV-Metal Line Electromigration Process. Crystals 2024, 14, 37.
https://doi.org/10.3390/cryst14010037
AMA Style
Gong T, Xie L, Chen S, Lu X, Zhao M, Zhu J, Yang X, Wang Z.
Research on Crystal Structure Evolution and Failure Mechanism during TSV-Metal Line Electromigration Process. Crystals. 2024; 14(1):37.
https://doi.org/10.3390/cryst14010037
Chicago/Turabian Style
Gong, Tao, Liangliang Xie, Si Chen, Xiangjun Lu, Mingrui Zhao, Jianyuan Zhu, Xiaofeng Yang, and Zhizhe Wang.
2024. "Research on Crystal Structure Evolution and Failure Mechanism during TSV-Metal Line Electromigration Process" Crystals 14, no. 1: 37.
https://doi.org/10.3390/cryst14010037
APA Style
Gong, T., Xie, L., Chen, S., Lu, X., Zhao, M., Zhu, J., Yang, X., & Wang, Z.
(2024). Research on Crystal Structure Evolution and Failure Mechanism during TSV-Metal Line Electromigration Process. Crystals, 14(1), 37.
https://doi.org/10.3390/cryst14010037
