Suzuki, K.; Takano, K.; Suzuki, S.; Hanawa, H.; Tsuji, N.; Ando, T.; Hoshi, K.; Minato, Y.; Ishimoto, S.; Sakurai, Y.;
et al. Non-Destructive Analysis of a High-Power Capacitor Using High-Energy X-ray Compton Scattering. Crystals 2022, 12, 824.
https://doi.org/10.3390/cryst12060824
AMA Style
Suzuki K, Takano K, Suzuki S, Hanawa H, Tsuji N, Ando T, Hoshi K, Minato Y, Ishimoto S, Sakurai Y,
et al. Non-Destructive Analysis of a High-Power Capacitor Using High-Energy X-ray Compton Scattering. Crystals. 2022; 12(6):824.
https://doi.org/10.3390/cryst12060824
Chicago/Turabian Style
Suzuki, Kosuke, Kodai Takano, Shunta Suzuki, Hirotaka Hanawa, Naruki Tsuji, Tomoya Ando, Kazushi Hoshi, Yoshihiro Minato, Shuichi Ishimoto, Yoshiharu Sakurai,
and et al. 2022. "Non-Destructive Analysis of a High-Power Capacitor Using High-Energy X-ray Compton Scattering" Crystals 12, no. 6: 824.
https://doi.org/10.3390/cryst12060824
APA Style
Suzuki, K., Takano, K., Suzuki, S., Hanawa, H., Tsuji, N., Ando, T., Hoshi, K., Minato, Y., Ishimoto, S., Sakurai, Y., & Sakurai, H.
(2022). Non-Destructive Analysis of a High-Power Capacitor Using High-Energy X-ray Compton Scattering. Crystals, 12(6), 824.
https://doi.org/10.3390/cryst12060824
