Article Versions Notes

Song Y, Lv Z, Bai J, Niu S, Wu Z, Qin L, Chen Y, Liang L, Lei Y, Jia P, et al. Processes of the Reliability and Degradation Mechanism of High-Power Semiconductor Lasers. Crystals. 2022; 12(6):765. https://doi.org/10.3390/cryst12060765

Song, Yue, Zhiyong Lv, Jiaming Bai, Shen Niu, Zibo Wu, Li Qin, Yongyi Chen, Lei Liang, Yuxin Lei, Peng Jia, and et al. 2022. "Processes of the Reliability and Degradation Mechanism of High-Power Semiconductor Lasers" Crystals 12, no. 6: 765. https://doi.org/10.3390/cryst12060765

Song, Y., Lv, Z., Bai, J., Niu, S., Wu, Z., Qin, L., Chen, Y., Liang, L., Lei, Y., Jia, P., Shan, X., & Wang, L. (2022). Processes of the Reliability and Degradation Mechanism of High-Power Semiconductor Lasers. Crystals, 12(6), 765. https://doi.org/10.3390/cryst12060765