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Journal: Crystals, 2022
Volume: 12
Number: 623

Article: Impact of Anode Thickness on Breakdown Mechanisms in Vertical GaN PiN Diodes with Planar Edge Termination
Authors: by Mona A. Ebrish, Matthew A. Porter, Alan G. Jacobs, James C. Gallagher, Robert J. Kaplar, Brendan P. Gunning, Karl D. Hobart and Travis J. Anderson
Link: https://www.mdpi.com/2073-4352/12/5/623

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