Order Article Reprints

Huang C-H, Lee P-H, Chang S-H, Kuo H-C, Sun C-W, Lin C-C, Tsai C-L, Liu X. Automated Optical Inspection Method for Light-Emitting Diode Defect Detection Using Unsupervised Generative Adversarial Neural Network. Crystals. 2021; 11(9):1048. https://doi.org/10.3390/cryst11091048

Huang, Che-Hsuan, Pei-Hsuan Lee, Shu-Hsiu Chang, Hao-Chung Kuo, Chia-Wei Sun, Chien-Chung Lin, Chun-Lin Tsai, and Xinke Liu. 2021. "Automated Optical Inspection Method for Light-Emitting Diode Defect Detection Using Unsupervised Generative Adversarial Neural Network" Crystals 11, no. 9: 1048. https://doi.org/10.3390/cryst11091048

Huang, C.-H., Lee, P.-H., Chang, S.-H., Kuo, H.-C., Sun, C.-W., Lin, C.-C., Tsai, C.-L., & Liu, X. (2021). Automated Optical Inspection Method for Light-Emitting Diode Defect Detection Using Unsupervised Generative Adversarial Neural Network. Crystals, 11(9), 1048. https://doi.org/10.3390/cryst11091048