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Journal: Crystals, 2021
Volume: 11
Number: 980
Article:
RF-Characterization of HZO Thin Film Varactors
Authors:
by
Sukhrob Abdulazhanov, Quang Huy Le, Dang Khoa Huynh, Defu Wang, Maximilian Lederer, Ricardo Olivo, Konstantin Mertens, Jennifer Emara, Thomas Kämpfe and Gerald Gerlach
Link:
https://www.mdpi.com/2073-4352/11/8/980
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