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Journal: Crystals, 2021
Volume: 11
Number: 485
Article:
Design of New Au–NiCo MEMS Vertical Probe for Fine-Pitch Wafer-Level Probing
Authors:
by
Xuan Luc Le and Sung-Hoon Choa
Link:
https://www.mdpi.com/2073-4352/11/5/485
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