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Journal: Crystals, 2021
Volume: 11
Number: 239
Article:
X-Ray Photoelectron Spectroscopy Depth Profiling of As-Grown and Annealed Titanium Nitride Thin Films
Authors:
by
Monzer Maarouf, Muhammad Baseer Haider, Qasem Ahmed Drmosh and Mogtaba B. Mekki
Link:
https://www.mdpi.com/2073-4352/11/3/239
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