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Journal: Crystals, 2021
Volume: 11
Number: 239

Article: X-Ray Photoelectron Spectroscopy Depth Profiling of As-Grown and Annealed Titanium Nitride Thin Films
Authors: by Monzer Maarouf, Muhammad Baseer Haider, Qasem Ahmed Drmosh and Mogtaba B. Mekki
Link: https://www.mdpi.com/2073-4352/11/3/239

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