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Journal: Micromachines, 2025
Volume: 16
Number: 1212
Article:
Soft-Error-Resilient Static Random Access Memory with Enhanced Write Ability for Radiation Environments
Authors:
by
Se-Yeon Park, Eun Gyo Jeong and Sung-Hun Jo
Link:
https://www.mdpi.com/2072-666X/16/11/1212
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