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Journal: Micromachines, 2024
Volume: 15
Number: 985

Article: Prediction of IGBT Gate Oxide Layer’s Performance Degradation Based on MultiScaleFormer Network
Authors: by Shilie He, Meiling Yu, Yiqiang Chen, Zhenwei Zhou, Lubin Yu, Chao Zhang and Yuanhua Ni
Link: https://www.mdpi.com/2072-666X/15/8/985

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