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Journal: Micromachines, 2024
Volume: 15
Number: 956

Article: Electromigration in Nano-Interconnects: Determining Reliability Margins in Redundant Mesh Networks Using a Scalable Physical–Statistical Hybrid Paradigm
Authors: by Houman Zahedmanesh
Link: https://www.mdpi.com/2072-666X/15/8/956

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