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Journal: Micromachines, 2024
Volume: 15
Number: 956
Article:
Electromigration in Nano-Interconnects: Determining Reliability Margins in Redundant Mesh Networks Using a Scalable Physical–Statistical Hybrid Paradigm
Authors:
by
Houman Zahedmanesh
Link:
https://www.mdpi.com/2072-666X/15/8/956
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