Dong, R.; Lu, H.; Yang, C.; Zhang, Y.; Yao, R.; Wang, Y.; Zhang, Y.
A Method for Automatically Predicting the Radiation-Induced Vulnerability of Unit Integrated Circuits. Micromachines 2024, 15, 541.
https://doi.org/10.3390/mi15040541
AMA Style
Dong R, Lu H, Yang C, Zhang Y, Yao R, Wang Y, Zhang Y.
A Method for Automatically Predicting the Radiation-Induced Vulnerability of Unit Integrated Circuits. Micromachines. 2024; 15(4):541.
https://doi.org/10.3390/mi15040541
Chicago/Turabian Style
Dong, Rui, Hongliang Lu, Caozhen Yang, Yutao Zhang, Ruxue Yao, Yujian Wang, and Yuming Zhang.
2024. "A Method for Automatically Predicting the Radiation-Induced Vulnerability of Unit Integrated Circuits" Micromachines 15, no. 4: 541.
https://doi.org/10.3390/mi15040541
APA Style
Dong, R., Lu, H., Yang, C., Zhang, Y., Yao, R., Wang, Y., & Zhang, Y.
(2024). A Method for Automatically Predicting the Radiation-Induced Vulnerability of Unit Integrated Circuits. Micromachines, 15(4), 541.
https://doi.org/10.3390/mi15040541