Živanović, E.; Veljković, S.; Mitrović, N.; Jovanović, I.; Djorić-Veljković, S.; Paskaleva, A.; Spassov, D.; Danković, D.
A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress. Micromachines 2024, 15, 503.
https://doi.org/10.3390/mi15040503
AMA Style
Živanović E, Veljković S, Mitrović N, Jovanović I, Djorić-Veljković S, Paskaleva A, Spassov D, Danković D.
A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress. Micromachines. 2024; 15(4):503.
https://doi.org/10.3390/mi15040503
Chicago/Turabian Style
Živanović, Emilija, Sandra Veljković, Nikola Mitrović, Igor Jovanović, Snežana Djorić-Veljković, Albena Paskaleva, Dencho Spassov, and Danijel Danković.
2024. "A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress" Micromachines 15, no. 4: 503.
https://doi.org/10.3390/mi15040503
APA Style
Živanović, E., Veljković, S., Mitrović, N., Jovanović, I., Djorić-Veljković, S., Paskaleva, A., Spassov, D., & Danković, D.
(2024). A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress. Micromachines, 15(4), 503.
https://doi.org/10.3390/mi15040503
