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Journal: Micromachines, 2024
Volume: 15
Number: 201

Article: Simulation Study on the Charge Collection Mechanism of FinFET Devices in Single-Event Upset
Authors: by Hongwei Zhang, Yang Guo, Shida Wang, Yi Sun, Bo Mei, Min Tang and Jingyi Liu
Link: https://www.mdpi.com/2072-666X/15/2/201

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