Zhang, H.; Guo, Y.; Wang, S.; Sun, Y.; Mei, B.; Tang, M.; Liu, J.
Simulation Study on the Charge Collection Mechanism of FinFET Devices in Single-Event Upset. Micromachines 2024, 15, 201.
https://doi.org/10.3390/mi15020201
AMA Style
Zhang H, Guo Y, Wang S, Sun Y, Mei B, Tang M, Liu J.
Simulation Study on the Charge Collection Mechanism of FinFET Devices in Single-Event Upset. Micromachines. 2024; 15(2):201.
https://doi.org/10.3390/mi15020201
Chicago/Turabian Style
Zhang, Hongwei, Yang Guo, Shida Wang, Yi Sun, Bo Mei, Min Tang, and Jingyi Liu.
2024. "Simulation Study on the Charge Collection Mechanism of FinFET Devices in Single-Event Upset" Micromachines 15, no. 2: 201.
https://doi.org/10.3390/mi15020201
APA Style
Zhang, H., Guo, Y., Wang, S., Sun, Y., Mei, B., Tang, M., & Liu, J.
(2024). Simulation Study on the Charge Collection Mechanism of FinFET Devices in Single-Event Upset. Micromachines, 15(2), 201.
https://doi.org/10.3390/mi15020201