Tyaginov, S.; O’Sullivan, B.; Chasin, A.; Rawal, Y.; Chiarella, T.; de Carvalho Cavalcante, C.T.; Kimura, Y.; Vandemaele, M.; Ritzenthaler, R.; Mitard, J.;
et al. Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs. Micromachines 2023, 14, 1514.
https://doi.org/10.3390/mi14081514
AMA Style
Tyaginov S, O’Sullivan B, Chasin A, Rawal Y, Chiarella T, de Carvalho Cavalcante CT, Kimura Y, Vandemaele M, Ritzenthaler R, Mitard J,
et al. Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs. Micromachines. 2023; 14(8):1514.
https://doi.org/10.3390/mi14081514
Chicago/Turabian Style
Tyaginov, Stanislav, Barry O’Sullivan, Adrian Chasin, Yaksh Rawal, Thomas Chiarella, Camila Toledo de Carvalho Cavalcante, Yosuke Kimura, Michiel Vandemaele, Romain Ritzenthaler, Jerome Mitard,
and et al. 2023. "Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs" Micromachines 14, no. 8: 1514.
https://doi.org/10.3390/mi14081514
APA Style
Tyaginov, S., O’Sullivan, B., Chasin, A., Rawal, Y., Chiarella, T., de Carvalho Cavalcante, C. T., Kimura, Y., Vandemaele, M., Ritzenthaler, R., Mitard, J., Palayam, S. V., Reifsnider, J., & Kaczer, B.
(2023). Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs. Micromachines, 14(8), 1514.
https://doi.org/10.3390/mi14081514
