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Journal: Micromachines, 2023
Volume: 14
Number: 959

Article: Performance Degradation Modeling and Its Prediction Algorithm of an IGBT Gate Oxide Layer Based on a CNN-LSTM Network
Authors: by Xin Wang, Zhenwei Zhou, Shilie He, Junbin Liu and Wei Cui
Link: https://www.mdpi.com/2072-666X/14/5/959

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