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Journal: Micromachines, 2023
Volume: 14
Number: 1028

Article: Research on Temperature Dependence of Single-Event Burnout in Power MOSFETs
Authors: by Chen Wang, Yi Liu, Changqing Xu, Xinfang Liao, Dongdong Chen and Zhenyu Wu
Link: https://www.mdpi.com/2072-666X/14/5/1028

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