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Journal: Micromachines, 2022
Volume: 13
Number: 1276

Article: On-State Current Degradation Owing to Displacement Defect by Terrestrial Cosmic Rays in Nanosheet FET
Authors: by Jonghyeon Ha, Gyeongyeop Lee, Hagyoul Bae, Kihyun Kim, Jin-Woo Han and Jungsik Kim
Link: https://www.mdpi.com/2072-666X/13/8/1276

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