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Journal: Micromachines, 2022
Volume: 13
Number: 808

Article: Investigation of Negative Bias Temperature Instability Effect in Nano PDSOI PMOSFET
Authors: by Yafang Yang, Hongxia Liu, Kun Yang, Zihou Gao and Zixu Liu
Link: https://www.mdpi.com/2072-666X/13/5/808

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