Broadband Waveguide Chip Design with Phase Measurement Function for Enhancing Optical Interferometric Imaging

Round 1

Reviewer 1 Report

Comments and Suggestions for Authors

This paper introduces a novel broadband waveguide chip design that incorporates a phase measurement function. Expanding the bandwidth of the device can significantly improve the SNR of the interferometric imaging system, thereby enhancing overall imaging quality. The overall writing of the article is good, but there are a few issues:

(1)    The properties of integrated photonic devices are affected by losses. Does waveguide loss have an impact on the devices designed in this article?

(2)    In line 229 of the article, it is mentioned that what are the benefits of using a cosine-type bending waveguide structure compared to an S-bend region.

(3)    It is necessary to indicate the splitting ratio in section 2.4.3 of the text when the outputs of the two output ports meet the design requirements of a 1:1 splitting ratio.

 

(4)    Is the bent waveguide Euler bending in Figure 24 of the text?

Comments on the Quality of English Language

Minor editing of English language required.

Author Response

Thank you for your review, please see the attachment.

Author Response File: Author Response.pdf

Reviewer 2 Report

Comments and Suggestions for Authors

Comments to the authors are attached. 

Comments for author File: Comments.pdf

Author Response

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Author Response File: Author Response.pdf

Round 2

Reviewer 1 Report

Comments and Suggestions for Authors

this paper can be accepted

Reviewer 2 Report

Comments and Suggestions for Authors

The revised manuscript entitled "Broadband Waveguide Chip Design with Phase Measurement Function for Enhancing Optical Interferometric Imaging” by Yan Li et al. explores an innovative broadband waveguide chip design utilizing silicon. This design improves imaging quality through the optimization of various layers and parameters. Notably, it demonstrates a phase measurement deviation of 5° over a wavelength range of 300 nm (from 1400 nm to 1700 nm), facilitating progress in optical interferometric imaging technologies. The authors have enhanced the manuscript by detailing their research work through modifications, figures, and content. Additionally, they provided satisfactory responses to the comments that were raised. The article will be the appropriate form for publication in remote sensing.