Delalieux, S.; Auwerkerken, A.; Verstraeten, W.W.; Somers, B.; Valcke, R.; Lhermitte, S.; Keulemans, J.; Coppin, P.
Hyperspectral Reflectance and Fluorescence Imaging to Detect Scab Induced Stress in Apple Leaves. Remote Sens. 2009, 1, 858-874.
https://doi.org/10.3390/rs1040858
AMA Style
Delalieux S, Auwerkerken A, Verstraeten WW, Somers B, Valcke R, Lhermitte S, Keulemans J, Coppin P.
Hyperspectral Reflectance and Fluorescence Imaging to Detect Scab Induced Stress in Apple Leaves. Remote Sensing. 2009; 1(4):858-874.
https://doi.org/10.3390/rs1040858
Chicago/Turabian Style
Delalieux, Stephanie, Annemarie Auwerkerken, Willem W. Verstraeten, Ben Somers, Roland Valcke, Stefaan Lhermitte, Johan Keulemans, and Pol Coppin.
2009. "Hyperspectral Reflectance and Fluorescence Imaging to Detect Scab Induced Stress in Apple Leaves" Remote Sensing 1, no. 4: 858-874.
https://doi.org/10.3390/rs1040858
APA Style
Delalieux, S., Auwerkerken, A., Verstraeten, W. W., Somers, B., Valcke, R., Lhermitte, S., Keulemans, J., & Coppin, P.
(2009). Hyperspectral Reflectance and Fluorescence Imaging to Detect Scab Induced Stress in Apple Leaves. Remote Sensing, 1(4), 858-874.
https://doi.org/10.3390/rs1040858
