Biliouris, D.; Van der Zande, D.; Verstraeten, W.W.; Stuckens, J.; Muys, B.; Dutré, P.; Coppin, P.
RPV Model Parameters Based on Hyperspectral Bidirectional Reflectance Measurementsof Fagus sylvatica L. Leaves. Remote Sens. 2009, 1, 92-106.
https://doi.org/10.3390/rs1020092
AMA Style
Biliouris D, Van der Zande D, Verstraeten WW, Stuckens J, Muys B, Dutré P, Coppin P.
RPV Model Parameters Based on Hyperspectral Bidirectional Reflectance Measurementsof Fagus sylvatica L. Leaves. Remote Sensing. 2009; 1(2):92-106.
https://doi.org/10.3390/rs1020092
Chicago/Turabian Style
Biliouris, Dimitrios, Dimitry Van der Zande, Willem W. Verstraeten, Jan Stuckens, Bart Muys, Philip Dutré, and Pol Coppin.
2009. "RPV Model Parameters Based on Hyperspectral Bidirectional Reflectance Measurementsof Fagus sylvatica L. Leaves" Remote Sensing 1, no. 2: 92-106.
https://doi.org/10.3390/rs1020092
APA Style
Biliouris, D., Van der Zande, D., Verstraeten, W. W., Stuckens, J., Muys, B., Dutré, P., & Coppin, P.
(2009). RPV Model Parameters Based on Hyperspectral Bidirectional Reflectance Measurementsof Fagus sylvatica L. Leaves. Remote Sensing, 1(2), 92-106.
https://doi.org/10.3390/rs1020092
