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Open AccessReview

Surface Characterization of Polymer Blends by XPS and ToF-SIMS

by Chi Ming Chan 1,2,* and Lu-Tao Weng 2,3
1
Division of Environment, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China
2
Department of Chemical and Biomolecular Engineering, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China
3
Materials Characterization and Preparation Facility, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China
*
Author to whom correspondence should be addressed.
Academic Editor: Volker Altstadt
Materials 2016, 9(8), 655; https://doi.org/10.3390/ma9080655
Received: 16 June 2016 / Revised: 25 July 2016 / Accepted: 29 July 2016 / Published: 4 August 2016
(This article belongs to the Special Issue Polymer Blends and Compatibilization)
The surface properties of polymer blends are important for many industrial applications. The physical and chemical properties at the surface of polymer blends can be drastically different from those in the bulk due to the surface segregation of the low surface energy component. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary mass spectrometry (ToF-SIMS) have been widely used to characterize surface and bulk properties. This review provides a brief introduction to the principles of XPS and ToF-SIMS and their application to the study of the surface physical and chemical properties of polymer blends. View Full-Text
Keywords: polymer blends; surface structures and chemical properties; ToF-SIMS; XPS polymer blends; surface structures and chemical properties; ToF-SIMS; XPS
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MDPI and ACS Style

Chan, C.M.; Weng, L.-T. Surface Characterization of Polymer Blends by XPS and ToF-SIMS. Materials 2016, 9, 655.

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