Cheney, D.J.; Douglas, E.A.; Liu, L.; Lo, C.-F.; Gila, B.P.; Ren, F.; Pearton, S.J.
Degradation Mechanisms for GaN and GaAs High Speed Transistors. Materials 2012, 5, 2498-2520.
https://doi.org/10.3390/ma5122498
AMA Style
Cheney DJ, Douglas EA, Liu L, Lo C-F, Gila BP, Ren F, Pearton SJ.
Degradation Mechanisms for GaN and GaAs High Speed Transistors. Materials. 2012; 5(12):2498-2520.
https://doi.org/10.3390/ma5122498
Chicago/Turabian Style
Cheney, David J., Erica A. Douglas, Lu Liu, Chien-Fong Lo, Brent P. Gila, Fan Ren, and Stephen J. Pearton.
2012. "Degradation Mechanisms for GaN and GaAs High Speed Transistors" Materials 5, no. 12: 2498-2520.
https://doi.org/10.3390/ma5122498
APA Style
Cheney, D. J., Douglas, E. A., Liu, L., Lo, C.-F., Gila, B. P., Ren, F., & Pearton, S. J.
(2012). Degradation Mechanisms for GaN and GaAs High Speed Transistors. Materials, 5(12), 2498-2520.
https://doi.org/10.3390/ma5122498