Blahuta, S.; Bessière, A.; Viana, B.; Ouspenski, V.; Mattmann, E.; Lejay, J.; Gourier, D.
Defects Identification and Effects of Annealing on Lu2(1-x)Y2xSiO5 (LYSO) Single Crystals for Scintillation Application. Materials 2011, 4, 1224-1237.
https://doi.org/10.3390/ma4071224
AMA Style
Blahuta S, Bessière A, Viana B, Ouspenski V, Mattmann E, Lejay J, Gourier D.
Defects Identification and Effects of Annealing on Lu2(1-x)Y2xSiO5 (LYSO) Single Crystals for Scintillation Application. Materials. 2011; 4(7):1224-1237.
https://doi.org/10.3390/ma4071224
Chicago/Turabian Style
Blahuta, Samuel, Aurélie Bessière, Bruno Viana, Vladimir Ouspenski, Eric Mattmann, Julien Lejay, and Didier Gourier.
2011. "Defects Identification and Effects of Annealing on Lu2(1-x)Y2xSiO5 (LYSO) Single Crystals for Scintillation Application" Materials 4, no. 7: 1224-1237.
https://doi.org/10.3390/ma4071224
APA Style
Blahuta, S., Bessière, A., Viana, B., Ouspenski, V., Mattmann, E., Lejay, J., & Gourier, D.
(2011). Defects Identification and Effects of Annealing on Lu2(1-x)Y2xSiO5 (LYSO) Single Crystals for Scintillation Application. Materials, 4(7), 1224-1237.
https://doi.org/10.3390/ma4071224
